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• SETUP

The ELIAS Emission Line Analyzing Spectrometers belong to a worldwide unique monochromator series which provide quantitatively high-resolution spectral analysis of narrow linewidth laser profiles with intensity dynamics of up to 4 orders. By applying CCD detectors with a signal-to-noise ratio of up to 40,000, the line profiles can be detected simultaneously within their spectral vicinity. The patented optical design with echelle grating features a nearly diffraction-limited imaging and a sufficiently high linear dispersion to resolve the halfwidths of the lines with 5-10 pixels considering the typical pixel widths of the line-array detector. A 360 mm wide echelle grating within a Littrow arrangement can be used alternatively in a single, double or even quadruple pass ELIAS setup. This allows to work either with an extremely high resolving capability for profile characterization or with a reduced resolving capability but larger inspection range and higher sensitivity. By a 2.5 m off-axis paraboloid and the accompanying anarmophotic magnification optics with a tangential image reproduction scale of 4:1, a camera focal distance of 10 m is attained.

The ELIAS spectrometers are extremely thermally and mechanically stable. All models are equipped with fully motorized optomechanics for the automatic focusing and positioning of the spectrum on the detector. By applying reflection optics with broadband UV layers, chromatic aberrations are avoided. The light coupling into the spectrometer is realized via SMA fiber or reflection transfer optics.

The supplied operating software Sophi with optional LabVIEW library for complete remote control of the ELIAS allows fully access of all spectrometer-detector functions via graphic user interface. A scan mode provides the sequential measurements of a larger wavelength range, larger than the free spectral range at a time.