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Key features
l Up to 130 kHz full-spectrum readout rate
l -80 dBm/nm sensitivity.
l 2.0 – 5.0 μm bandwidth
l Fiber-coupled input
l Plug-n-play
Learn more
Do you want discuss how the S2050 mid-infrared spectrometer can be used in your project?
You can also download the data sheet to get more technical details.
S2050-400 | S2050-1k* | S2050-130k* | unit | |
Optical bandwidth | 2-5 | μm | ||
Resolution | 6 | 3 | 2.5 | cm-1 |
Exposure time(1) | 10.8-1E6 | 9-1E6 | 1.3-654 | μs |
Max. readout rate | 400 | 1.4E3 | 130E3 | Hz |
Bit depth | 16 | 12 | ||
Sensitivity | 130E3 | 8E3 | 1.6E3 | counts/(ms μW) |
Dark noise std.(2) | 11 | 60 | 1 | counts |
Minimum detectable power in 100 ms | 5 | 75 | 25 | pW/nm |
Optical input(3) | SMA-905 fber connector | |||
Polarization direction | Vertical | |||
Maximum operating temperature | 30 | ℃ | ||
Physical dimensions(H×L×W) | 100×306× 200 | mm3 | ||
Weight(4) | 5 | kg | ||
* Spectrometer is a bundle of two devices connected by optical fber.
(1)Longer effective exposure times can be achieved for the S2050-130k model by stackingacquired spectra.
(2)At minimum exposure time.
(3)Fiber port is removeable for free-space use.
(4)For bundle devices: add weight of second device (approx. 2 kg).
Spectrometer Details
Developers in both industry and research use mid-infrared (MIR) spectrometers for non-invasive characterization of gases, liquids, and solids as well as characterization of light sources. The NLIR 2.0 – 5.0 µm Spectrometer (S2050-400/S2050-130k) is based on a novel measurement scheme that upconverts the MIR light to near-visible light. Silicon-based near-visible light detectors are far superior to MIR light detectors in terms of detectivity, speed, and noise. The NLIR upconversion technology, therefore, brings these attractive features and the advantages that follow, to the MIR regime.
Both editions seen below have sensitivities at -80 dBm/nm or better, and the maximum full-spectrum readout rate is 130 kHz! As a result, the spectrometer enables the characterization of light sources and measuring spectral content from chemical processes with a time resolution of less than 10 µs.
Spectrometer Measurements Examples
40 kHz Single Pulse Measurement
Single pulses from a super-continuum light source with a bandwidth of 3.0 µm – 4.2 µm and a repetition rate of 40 kHz of 2 ns pulses were measured with 80 kHz readout rate. In the figure, (a) shows raw data of 12 ms data acquisition, (b) shows a zoom where every other readout is empty as expected from 40 kHz rep-rate and 80 kHz sampling, (c) shows 10 raw consecutive spectra. The fluctuations in the spectra are by far dominated by noise from the light source.
Based on this measurement, the S2050-130k spectrometer is capable of characterizing fast modulations of infrared lasers and other dynamic events.
Plastic Transmission
A 30 W globar was the mid-infrared light source in these transmission measurements of a 50 µm polystyrene (PS) film and a 800 µm polyethylene terephthalate (PET) film. The S2050-400 spectrometer was set to 20 ms exposure time and capturing just single shots. No averaging or smoothing has been applied to the data subsequently.
Computer algorithms can certainly tolerate a much shorter exposure time, and thus a faster acquisition, in the context of plastic recognition or thickness analysis.
Optical Coating Transmission
A 30 W globar was the mid-infrared light source for these transmission measurements of coated optical windows: a Ge bandpass filter (BPF) for 3.7 – 4.5 µm and a YAG mirror coated with high reflection at 1064 nm and high transmission at 2.1 -4.5 µm. The S2050-400 spectrometer was set to 20 ms exposure time and captured just single shots. No averaging or smoothing has been applied to the data subsequently.
Coating quality control or production monitoring require such measurements.